104159000: Scanning electron microscopy study (procedure)

SNOMED CT Concept\Procedure\...

\intervention selon le dispositif\Microscopy\Electron microscopic study\Scanning electron microscopy study

\intervention selon la méthode\Evaluation procedure (procedure)\examen selon la méthode\inspection\Microscopy\Electron microscopic study\Scanning electron microscopy study
\intervention selon la méthode\Interview, history AND/OR physical examination\examen selon la méthode\inspection\Microscopy\Electron microscopic study\Scanning electron microscopy study

Status: current, Not sufficiently defined by necessary conditions definition status (core metadata concept). Date: 31-Jan 2002. Module: SNOMED CT core

Descriptions:

Id Description Lang Type Status Case? Module

168028018 Scanning electron microscopy study en Synonym (core metadata concept) Active Entire term case insensitive (core metadata concept) SNOMED CT core
168029014 Scanning electron microscopy study, NOS en Synonym (core metadata concept) Inactive Only initial character case insensitive (core metadata concept) SNOMED CT core
559378012 Scanning electron microscopy study (procedure) en Fully specified name Active Entire term case insensitive (core metadata concept) SNOMED CT core

Expanded Value Set

Outbound Relationships	Type	Target	Active	Characteristic	Refinability	Group	Values
Scanning electron microscopy study	est un(e) (attribut)	Electron microscopic study	true	Inferred relationship	Some
Scanning electron microscopy study	élément (attribut)	entité observable d'un échantillon (entité observable)	false	Inferred relationship	Some
Scanning electron microscopy study	méthode (attribut)	Inspection - action	false	Inferred relationship	Some	1
Scanning electron microscopy study	Direct device	Microscope	false	Inferred relationship	Some
Scanning electron microscopy study	Using	Microscope	false	Inferred relationship	Some	1
Scanning electron microscopy study	Using device (attribute)	Microscope	false	Inferred relationship	Some	1
Scanning electron microscopy study	Using device (attribute)	Microscope	true	Inferred relationship	Some	1
Scanning electron microscopy study	méthode (attribut)	Inspection - action	true	Inferred relationship	Some	1
Scanning electron microscopy study	méthode (attribut)	Microscopy - action	false	Inferred relationship	Some
Scanning electron microscopy study	a pour but (attribut)	à visée diagnostique	false	Inferred relationship	Some
Scanning electron microscopy study	méthode (attribut)	Investigation - action	false	Inferred relationship	Some

Inbound Relationships	Type	Active	Source	Characteristic	Refinability	Group
Electron microscopy scanning technique, complete	est un(e) (attribut)	True	Scanning electron microscopy study	Inferred relationship	Some
Electron microscopy study, scanning, examination and report	est un(e) (attribut)	True	Scanning electron microscopy study	Inferred relationship	Some
Electron microscopy study, scanning, with X-ray analysis, examination and report	est un(e) (attribut)	True	Scanning electron microscopy study	Inferred relationship	Some

This concept is not in any reference sets